Zhaoxiang Wei

1PUBLICATIONS
1CO-AUTHORS
Photovoltaic devices (solar cells)
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

|Jan 21, 2022
Influence of Different Device Structures on the Degradation for Trench-Gate SiC MOSFETs: Taking Avalanche Stress as an Example.

Zhaoxiang Wei, Hao Fu, Xiaowen Yan

Pageof 1

Frequent Collaborators

1 joint publications

Jiaxing Wei