Patrick Fiorenza

13PUBLICATIONS
30CO-AUTHORS
Elemental semiconductorsCompound semiconductorsEngineering electromagneticsDigital electronic devicesNanofabrication, growth and self assembly
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Publications (13)

|Jun 25, 2026
Insights into ALD Growth of Al-Based Dielectric Stack on 4H-SiC.

|Dec 15, 2025
Impact of the Schottky Barrier and Contact-Induced Strain Variations inside the Channel on the Electrical Behavior of Monolayer MoS<sub>2</sub> Transistors.

Salvatore Ethan Panasci, Emanuela Schilirò, Giuseppe Greco

|Apr 27, 2024
4H-SiC MOSFET Threshold Voltage Instability Evaluated via Pulsed High-Temperature Reverse Bias and Negative Gate Bias Stresses.

Laura Anoldo, Edoardo Zanetti, Walter Coco

|Nov 10, 2023
Large-Area MoS<sub>2</sub> Films Grown on Sapphire and GaN Substrates by Pulsed Laser Deposition.

Marianna Španková, Štefan Chromik, Edmund Dobročka

|Aug 26, 2023
Al<sub>2</sub>O<sub>3</sub> Layers Grown by Atomic Layer Deposition as Gate Insulator in 3C-SiC MOS Devices.

Emanuela Schilirò, Patrick Fiorenza, Raffaella Lo Nigro

|Oct 14, 2022
Nanotechnology for Electronic Materials and Devices.

Raffaella Lo Nigro, Patrick Fiorenza, Béla Pécz

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Frequent Collaborators

11 joint publications

Fabrizio Roccaforte

9 joint publications

Filippo Giannazzo

8 joint publications

Giuseppe Greco

5 joint publications

Béla Pécz