T M Braun

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Publications (3)
T M Braun, D Josell, J John
T M Braun, D Josell, M Silva
T M Braun, S-H Kim, H-J Lee

Get your video featured.

Get your video featured.
T M Braun, D Josell, J John
T M Braun, D Josell, M Silva
T M Braun, S-H Kim, H-J Lee

<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015

Accumulation and Analysis of Cuprous Ions in a Copper Sulfate Plating Solution
Published on : Mar 20, 2019

Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Published on : Dec 07, 2015