Hoon-Hwe Cho

2PUBLICATIONS
14CO-AUTHORS
Molecular and organic electronicsElectrical circuits and systems
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

Sort by Publication Date:
|Dec 31, 2024
Amorphous Carbon Monolayer: A van der Waals Interface for High-Performance Metal Oxide Semiconductor Devices.

Viswanath G Akkili, Jongchan Yoon, Kihyun Shin

|Apr 20, 2017
Modeling of Stresses and Strains during (De)Lithiation of Ni<sub>3</sub>Sn<sub>2</sub>-Coated Nickel Inverse-Opal Anodes.

Hoon-Hwe Cho, Matthew P B Glazer, David C Dunand

Pageof 1

Frequent Collaborators

1 joint publications

Viswanath G Akkili

1 joint publications

Sanghyun Jeong

1 joint publications

Ashish A Patil

1 joint publications

Frederick Aziadzo

1 joint publications

Suhyeon Kim

1 joint publications

Jung-Sub Wi

1 joint publications

Joon Sik Park

1 joint publications

Eui-Tae Kim

1 joint publications

Jaeyeong Heo

1 joint publications

Graeme Henkelman

Frequent Collaborators

1 joint publications

Viswanath G Akkili

1 joint publications

Sanghyun Jeong

1 joint publications

Ashish A Patil

1 joint publications

Frederick Aziadzo

JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies
Jove
Visualize
Contact Us

Top Related Videos

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

12.3K
Applying Dynamic Strain on Thin Oxide Films Immobilized on a Pseudoelastic Nickel-Titanium Alloy
09:35

Applying Dynamic Strain on Thin Oxide Films Immobilized on a Pseudoelastic Nickel-Titanium Alloy

Published on : Jul 28, 2020

5.4K
See more related videos

Top Related Videos

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

12.3K
Applying Dynamic Strain on Thin Oxide Films Immobilized on a Pseudoelastic Nickel-Titanium Alloy
09:35

Applying Dynamic Strain on Thin Oxide Films Immobilized on a Pseudoelastic Nickel-Titanium Alloy

Published on : Jul 28, 2020

5.4K
See more related videos