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Heejoon Chae, Hyunje Park, Dae Joon Kang
Hyunje Park, Jaeseok Hwang, Heejoon Chae

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on : Sep 14, 2018

High-resolution Patterning Using Two Modes of Electrohydrodynamic Jet: Drop on Demand and Near-field Electrospinning
Published on : Jul 10, 2018