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S Ito, M Arita, J Haruyama+11
J Haruyama
B Feng
W-C Chen
C-M Cheng
S-J Tang
T-C Chiang
O Sugino
F Komori
I Matsuda
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on : Dec 05, 2015