Jonghwan Lee
5PUBLICATIONS
2CO-AUTHORS
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Publications (5)
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|Mar 28, 2026
Noise-Robust Wafer Map Defect Classification via CNN-ESN Hybrid Architecture.Hayeon Choi, Dasom Im, Sangeun Oh
|Feb 26, 2026
TCAD Simulation of STI Depth and SiO2/Silicon Interface Trap Modulation Effects on Low-Frequency Noise in HZO-Based Nanosheet FETs.Wonbok Lee, Jonghwan Lee
|Sep 27, 2025
Enhancing Confidence and Interpretability of a CNN-Based Wafer Defect Classification Model Using Temperature Scaling and LIME.Jieun Lee, Yeonwoo Ju, Junho Lim
|Dec 17, 2024
TCAD Simulation of Resistive Switching Devices: Impact of ReRAM Configuration on Neuromorphic Computing.Seonggyeom Kim, Jonghwan Lee
|Feb 24, 2024
A Compact Memristor Model Based on Physics-Informed Neural Networks.Younghyun Lee, Kyeongmin Kim, Jonghwan Lee
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