Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Philip D Rack

27PUBLICATIONS

63CO-AUTHORS

Electrical energy generation (incl. renewables, excl. photovoltaics)PyrometallurgyAutomated software engineeringMicro- and nanosystemsNanofabrication, growth and self assembly

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (27)

Sort by Publication Date:

|Mar 03, 2026

Leveraging Combinatorial Sputtering to Investigate Ferroelectric Properties of the Hf<sub><i>x</i></sub>Zr<sub>1-<i>x</i></sub>O<sub>2</sub> System.

Matthew Flynn-Hepford, Kyle Sprecker, Saban M Hus

|Feb 26, 2026

Reactive Oxygen Ion Beam-Induced Deposition for Concurrent Purification of Platinum Nanostructures.

Kyle Sprecker, Sujoy Ghosh, Philip D Rack

|May 19, 2025

Machine Learning-Based Reward-Driven Tuning of Scanning Probe Microscopy: Toward Fully Automated Microscopy.

Yu Liu, Roger Proksch, Jason Bemis

|Nov 22, 2024

XeF<sub>2</sub> gas assisted focused electron beam induced etching of niobium thin films: towards direct write editing of niobium superconducting devices.

Spencer Gellerup, Reece Emery, Scott T Retterer

|Sep 16, 2024

Integration of scanning probe microscope with high-performance computing: Fixed-policy and reward-driven workflows implementation.

Yu Liu, Utkarsh Pratiush, Jason Bemis

|Feb 12, 2024

Selected Area Manipulation of MoS<sub>2</sub> via Focused Electron Beam-Induced Etching for Nanoscale Device Editing.

John Lasseter, Spencer Gellerup, Sujoy Ghosh

Pageof 5

Frequent Collaborators

4 joint publications

Cheng Zhang

3 joint publications

Steven J Randolph

3 joint publications

Anna N Hoffman

3 joint publications

Kai Xiao

3 joint publications

Sergei V Kalinin

3 joint publications

Jason D Fowlkes

3 joint publications

Guang Feng

2 joint publications

Thomas Zac Ward

2 joint publications

Wei Zhao

2 joint publications

Harald Plank

Frequent Collaborators

4 joint publications

Cheng Zhang

3 joint publications

Steven J Randolph

3 joint publications

Anna N Hoffman

3 joint publications

Kai Xiao

Top Related Videos

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe<sub>1+</sub><em><sub>Y</sub></em>Te Using a Spin-polarized Scanning Tunneling Microscope

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe<sub>1+</sub><em><sub>Y</sub></em>Te Using a Spin-polarized Scanning Tunneling Microscope

Published on : Mar 24, 2019

A Continuous-flow Photocatalytic Reactor for the Precisely Controlled Deposition of Metallic Nanoparticles

A Continuous-flow Photocatalytic Reactor for the Precisely Controlled Deposition of Metallic Nanoparticles

Published on : Apr 10, 2019

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

See more related videos

Top Related Videos

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe<sub>1+</sub><em><sub>Y</sub></em>Te Using a Spin-polarized Scanning Tunneling Microscope

Visualizing Uniaxial-strain Manipulation of Antiferromagnetic Domains in Fe<sub>1+</sub><em><sub>Y</sub></em>Te Using a Spin-polarized Scanning Tunneling Microscope

Published on : Mar 24, 2019

A Continuous-flow Photocatalytic Reactor for the Precisely Controlled Deposition of Metallic Nanoparticles

A Continuous-flow Photocatalytic Reactor for the Precisely Controlled Deposition of Metallic Nanoparticles

Published on : Apr 10, 2019

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on : Jun 13, 2023

See more related videos