Nobuyuki Ishida
3PUBLICATIONS
1CO-AUTHORS

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Publications (3)
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|Nov 22, 2024
Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy.Nobuyuki Ishida, Takaaki Mano
|Nov 09, 2023
Quantitative characterization of built-in potential profile across GaAs p-n junctions using Kelvin probe force microscopy with qPlus sensor AFM.Nobuyuki Ishida, Takaaki Mano
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