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Chaeyun Kim

1PUBLICATIONS

2CO-AUTHORS

Electrical circuits and systems

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Publications (1)

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|Apr 27, 2024

The Effects of a Gate Bias Condition on 1.2 kV SiC MOSFETs during Irradiating Gamma-Radiation.

Chaeyun Kim, Hyowon Yoon, Yeongeun Park

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Frequent Collaborators

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Hyowon Yoon

1 joint publications

Ogyun Seok

Frequent Collaborators

1 joint publications

Hyowon Yoon

1 joint publications

Ogyun Seok

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