Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Haochen Wang

3PUBLICATIONS
12CO-AUTHORS
Photovoltaic power systemsChemical and thermal processes in energy and combustionRadiation and matter
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (3)

Sort by Publication Date:
|Feb 10, 2026
Site-Selective Excitation of Defects Promotes Ultrafast Hot-Electron Transfer at the Semiconductor Interface.

Tianjun Wang, Kaiping Wang, Huizhi Xie

|Nov 10, 2020
In Situ Observation of Stepwise C-H Bond Scission: Deciphering the Catalytic Selectivity of Ethylbenzene-to-Styrene Conversion on TiO<sub>2</sub>.

Haiping Lin, Zhijun Wang, Haochen Wang

|Jun 12, 2019
Adsorption Features of Formaldehyde on TiO<sub>2</sub>(110) Surface Probed by High-Resolution Scanning Tunnelling Microscopy.

Haochen Wang, Xiangyun Zhao, Chuanqi Huang

Pageof 1

Frequent Collaborators

2 joint publications

Xueming Yang

1 joint publications

Wei-Xue Li

1 joint publications

Haiping Lin

1 joint publications

Yong Xu

1 joint publications

Qing Li

1 joint publications

Qing Guo

1 joint publications

Minghu Pan

1 joint publications

Kaiping Wang

1 joint publications

Bo Wen

1 joint publications

Zefeng Ren

Frequent Collaborators

2 joint publications

Xueming Yang

1 joint publications

Wei-Xue Li

1 joint publications

Haiping Lin

1 joint publications

Yong Xu

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.4K
Characterizing Lewis Pairs Using Titration Coupled with In Situ Infrared Spectroscopy
07:49

Characterizing Lewis Pairs Using Titration Coupled with In Situ Infrared Spectroscopy

Published on : Feb 20, 2020

9.7K
Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
10:28

Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

Published on : May 27, 2018

9.4K
See more related videos

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.4K
Characterizing Lewis Pairs Using Titration Coupled with In Situ Infrared Spectroscopy
07:49

Characterizing Lewis Pairs Using Titration Coupled with In Situ Infrared Spectroscopy

Published on : Feb 20, 2020

9.7K
Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
10:28

Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

Published on : May 27, 2018

9.4K
See more related videos