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Xiaoyu Ji, Xuebo Zhou, Shilin Zhu
Xiaodong Sun, Xuebo Zhou, Hao Sun
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on : May 10, 2021
Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
Published on : Jan 21, 2016
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on : Dec 05, 2015
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on : May 10, 2021
Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
Published on : Jan 21, 2016
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on : Dec 05, 2015