Niklas Pyrlik

3PUBLICATIONS
16CO-AUTHORS
Thermodynamics and statistical physicsPhotonics, optoelectronics and optical communicationsNonlinear optics and spectroscopy
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Publications (3)

|Oct 09, 2025
Ultimate sensitivity in X-ray diffraction: angular moments versus shot noise.

Peter Modregger, Felix Wittwer, Ahmar Khaliq

|Apr 03, 2021
Erratum: Ossig, C., et al. Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In, Ga)Se2 Solar Cell. Materials 2021, 14, 228.

Christina Ossig, Christian Strelow, Jan Flügge

|Jan 20, 2021
Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se2 Solar Cell.

Christina Ossig, Christian Strelow, Jan Flügge

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