Ziqiang Bi

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0CO-AUTHORS
Electronic device and system performance evaluation, testing and simulation
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Publications (1)

|Jan 23, 2024
A Comparative Study on the Degradation Behaviors of Ferroelectric Gate GaN HEMT with PZT and PZT/Al<sub>2</sub>O<sub>3</sub> Gate Stacks.

Lixiang Chen, Zhiqi Lu, Chaowei Fu

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