Tao Zhang
3PUBLICATIONS
10CO-AUTHORS
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Publications (3)
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|Apr 13, 2026
Author Correction: Wafer-scale high-κ HfO2 dielectric films with sub-5-Å equivalent oxide thickness for 2D MoS2 transistors.Songge Zhang, Tao Zhang, Hua Yu
|Jan 20, 2026
Wafer-scale high-κ HfO2 dielectric films with sub-5-Å equivalent oxide thickness for 2D MoS2 transistors.Songge Zhang, Tao Zhang, Hua Yu
|Jun 11, 2021
The interaction between vacancy defects in gallium sulfide monolayer and a new vacancy defect model.Tao Zhang, Ying Liang, Hao Guo
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