Sung Haeng Cho

1PUBLICATIONS
2CO-AUTHORS
Electrical circuits and systems
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Publications (1)

|Aug 31, 2017
Impact of transient currents caused by alternating drain stress in oxide semiconductors.

Hyeon-Jun Lee, Sung Haeng Cho, Katsumi Abe

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Frequent Collaborators

1 joint publications

Myoung-Jae Lee

1 joint publications

Minkyung Jung