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David R Hughart

1PUBLICATIONS

4CO-AUTHORS

Terahertz physics

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Publications (1)

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|Dec 03, 2022

Near-zero-field magnetoresistance measurements: A simple method to track atomic-scale defects involved in metal-oxide-semiconductor device reliability.

Stephen J Moxim, Fedor V Sharov, David R Hughart

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Frequent Collaborators

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Stephen J Moxim

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Fedor V Sharov

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Colin G McKay

1 joint publications

Patrick M Lenhan

Frequent Collaborators

1 joint publications

Stephen J Moxim

1 joint publications

Fedor V Sharov

1 joint publications

Colin G McKay

1 joint publications

Patrick M Lenhan

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