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Juan R Ramos-Serrano

1PUBLICATIONS

7CO-AUTHORS

Elemental semiconductors

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|Dec 31, 2025

Influence of the Si-Layer Thickness on the Structural, Compositional and Resistive Switching Properties of SiO<sub>2</sub>/Si/SiO<sub>2</sub> Stack Layers for Resistive Switching Memories.

Alfredo Morales-Sánchez, Karla E González-Flores, Jesús M Germán-Martínez

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Alfredo Benítez-Lara

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Luis Hernández-Martínez

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Mario Moreno-Moreno

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Alfredo Morales-Sánchez

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Braulio Palacios-Márquez

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Javier Flores-Méndez

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