Young-Joon Han

1PUBLICATIONS
3CO-AUTHORS
Nonlinear optics and spectroscopy
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Publications (1)

|Jul 20, 2019
Contactless, nondestructive determination of dopant profiles of localized boron-diffused regions in silicon wafers at room temperature.

Hieu T Nguyen, Zhuofeng Li, Young-Joon Han

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Frequent Collaborators

1 joint publications

Hieu T Nguyen

1 joint publications

Mike Tebyetekerwa

1 joint publications

Thien N Truong