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Desislava Mihaylova, Xinglong Chen, Hengdi Zhao
Bi-Xia Wang, M J Krogstad, H Zheng
Methods of <em>Ex Situ</em> and <em>In Situ</em> Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
Published on : Jun 07, 2018
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on : Dec 05, 2015
Radio Frequency Magnetron Sputtering of GdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub><sub>−</sub><sub>δ</sub>/ La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> Quasi-bilayer Films on SrTiO<sub>3</sub> (STO) Single-crystal Substrates
Published on : Apr 12, 2019
Methods of <em>Ex Situ</em> and <em>In Situ</em> Investigations of Structural Transformations: The Case of Crystallization of Metallic Glasses
Published on : Jun 07, 2018
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on : Dec 05, 2015
Radio Frequency Magnetron Sputtering of GdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub><sub>−</sub><sub>δ</sub>/ La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> Quasi-bilayer Films on SrTiO<sub>3</sub> (STO) Single-crystal Substrates
Published on : Apr 12, 2019