Ruibin Xue

1PUBLICATIONS
4CO-AUTHORS
Electrical circuits and systems
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Publications (1)

|Mar 19, 2024
The impact of thickness-related grain boundary migration on hole concentration and mobility of p-type transparent conducting CuI films.

Ruibin Xue, Gang Gao, Lei Yang

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Frequent Collaborators

1 joint publications

Gang Gao

1 joint publications

Liangge Xu

1 joint publications

Yumin Zhang

1 joint publications

Jiaqi Zhu