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Xin Ye, Ke Wang, Yajie Zou
Ke Wang, Xin Ye, Ram M Pendyala
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015
Establishing a Competing Risk Regression Nomogram Model for Survival Data
Published on : Oct 23, 2020
Development of an Individual-Tree Basal Area Increment Model using a Linear Mixed-Effects Approach
Published on : Jul 03, 2020
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015
Establishing a Competing Risk Regression Nomogram Model for Survival Data
Published on : Oct 23, 2020
Development of an Individual-Tree Basal Area Increment Model using a Linear Mixed-Effects Approach
Published on : Jul 03, 2020