Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Mu Gu

4PUBLICATIONS

7CO-AUTHORS

Instruments and techniquesElectrical energy generation (incl. renewables, excl. photovoltaics)Nonlinear optics and spectroscopy

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (4)

Sort by Publication Date:

|Sep 07, 2023

Ultrafast Decay, Ultrahigh Spatial Resolution, and Stable γ-CuI Single Crystal Treated by Iodine Annealing and SiO<sub>2</sub> Coating.

Shutong Hao, Xiaolin Liu, Qianli Li

|May 06, 2022

Dynamic instability of lithiated phosphorene.

Lingchun Jia, Hongchun Yuan, Yingli Chang

|Jan 11, 2021

High-Performance X-ray Detector Based on Single-Crystal β-Ga<sub>2</sub>O<sub>3</sub>:Mg.

Jiawen Chen, Huili Tang, Bo Liu

|Jun 09, 2020

Directional Control and Enhancement of Light Output of Scintillators by Using Microlens Arrays.

Di Yuan, Bo Liu, Zhichao Zhu

Pageof 1

Frequent Collaborators

2 joint publications

Bo Liu

1 joint publications

Chuanwei Cheng

1 joint publications

Zengxing Zhang

1 joint publications

Qiang Xu

1 joint publications

Lingchun Jia

1 joint publications

Jiajie Zhu

1 joint publications

Shutong Hao

Frequent Collaborators

2 joint publications

Bo Liu

1 joint publications

Chuanwei Cheng

1 joint publications

Zengxing Zhang

1 joint publications

Qiang Xu

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

$<em>In Situ</em> Neutron Powder Diffraction Using Custom-made Lithium-ion Batteries$

<em>In Situ</em> Neutron Powder Diffraction Using Custom-made Lithium-ion Batteries

Published on : Nov 10, 2014

Radio Frequency Magnetron Sputtering of GdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub><sub>−</sub><sub>δ</sub>/ La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> Quasi-bilayer Films on SrTiO<sub>3</sub> (STO) Single-crystal Substrates

Radio Frequency Magnetron Sputtering of GdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub><sub>−</sub><sub>δ</sub>/ La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> Quasi-bilayer Films on SrTiO<sub>3</sub> (STO) Single-crystal Substrates

Published on : Apr 12, 2019

See more related videos

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

$<em>In Situ</em> Neutron Powder Diffraction Using Custom-made Lithium-ion Batteries$

<em>In Situ</em> Neutron Powder Diffraction Using Custom-made Lithium-ion Batteries

Published on : Nov 10, 2014

Radio Frequency Magnetron Sputtering of GdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub><sub>−</sub><sub>δ</sub>/ La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> Quasi-bilayer Films on SrTiO<sub>3</sub> (STO) Single-crystal Substrates

Radio Frequency Magnetron Sputtering of GdBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub><sub>−</sub><sub>δ</sub>/ La<sub>0.67</sub>Sr<sub>0.33</sub>MnO<sub>3</sub> Quasi-bilayer Films on SrTiO<sub>3</sub> (STO) Single-crystal Substrates

Published on : Apr 12, 2019

See more related videos