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Chaohui Lan

1PUBLICATIONS
2CO-AUTHORS
Elemental semiconductors
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Journal

Publications (1)

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|Jul 01, 2019
Measurement of yield and spectrum of secondary electron emission and their characteristics under modification of conductive materials.

Jialong He, Jie Yang, Yufei Peng

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Frequent Collaborators

1 joint publications

Xi Li

1 joint publications

Jinshui Shi

Frequent Collaborators

1 joint publications

Xi Li

1 joint publications

Jinshui Shi

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