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P Bohm, M Sos, P Bilkova
M Farník, J Urban, J Zajac
D I Réfy, S Zoletnik, D Dunai
P Hacek, M Berta, G Anda

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Visualization of Low-Level Gamma Radiation Sources Using a Low-Cost, High-Sensitivity, Omnidirectional Compton Camera
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Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
Published on : Jan 19, 2020