F Bijkerk

1PUBLICATIONS
0CO-AUTHORS
Microelectromechanical systems (MEMS)
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

|Jun 06, 2018
Self-contained in-vacuum in situ thin film stress measurement tool.

J Reinink, R W E van de Kruijs, F Bijkerk

Pageof 1

Frequent Collaborators