Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Fabio Colasuonno

2PUBLICATIONS
6CO-AUTHORS
Solid state chemistryElectronic and magnetic properties of condensed matter; superconductivity
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

Sort by Publication Date:
|Jul 09, 2021
Oxygen and vacancy defects in silicon. A quantum mechanical characterization through the IR and Raman spectra.

Alexander Platonenko, Fabio Colasuonno, Francesco Silvio Gentile

|Jul 17, 2020
Interstitial defects in diamond: A quantum mechanical simulation of their EPR constants and vibrational spectra.

Fabio Colasuonno, Francesco Silvio Gentile, William Mackrodt

Pageof 1

Frequent Collaborators

2 joint publications

Francesco Silvio Gentile

2 joint publications

Alexander Platonenko

2 joint publications

Roberto Dovesi

1 joint publications

William Mackrodt

1 joint publications

Anna Maria Ferrari

1 joint publications

Fabien Pascale

Frequent Collaborators

2 joint publications

Francesco Silvio Gentile

2 joint publications

Alexander Platonenko

2 joint publications

Roberto Dovesi

1 joint publications

William Mackrodt

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.1K
High Resolution Phonon-assisted Quasi-resonance Fluorescence Spectroscopy
10:40

High Resolution Phonon-assisted Quasi-resonance Fluorescence Spectroscopy

Published on : Jun 28, 2016

7.8K
See more related videos

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.1K
High Resolution Phonon-assisted Quasi-resonance Fluorescence Spectroscopy
10:40

High Resolution Phonon-assisted Quasi-resonance Fluorescence Spectroscopy

Published on : Jun 28, 2016

7.8K
See more related videos