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L J Buntrock, C Volkmar, K Hannemann
K Holste, P Dietz, S Scharmann
C Volkmar, C Geile, A Neumann

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
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Optimization, Test and Diagnostics of Miniaturized Hall Thrusters
Published on : Feb 16, 2019

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on : Aug 20, 2019