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J B Titus, S Korepanov, A Tkachev
J B Titus, R M Magee, I Isakov
J B Titus, R M Magee, I Isakov

Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
Published on : Mar 29, 2016

Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization
Published on : Jul 17, 2015

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on : Jul 12, 2016