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Matvey Finkel, Holger Thierschmann, Allard J Katan+3
Holger Thierschmann
Allard J Katan
Marc P Westig
Teun M Klapwijk
Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on : Jun 13, 2023