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Zhen Sun, Jon K Baldwin, Wei Xu+5
E M Bates, W J Birmingham, C A Romero-Talamás
E M Bates
Jon K Baldwin
Zhehui Wang
Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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A Novel Biaxial Testing Apparatus for the Determination of Forming Limit under Hot Stamping Conditions
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