Łukasz Borowik

2PUBLICATIONS
3CO-AUTHORS
Colloid and surface chemistryFunctional materials
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Publications (2)

|Sep 02, 2021
Correlative analysis of embedded silicon interface passivation by Kelvin probe force microscopy and corona oxide characterization of semiconductor.

Valentin Aubriet, Kristell Courouble, Mickael Gros-Jean

|May 03, 2018
Calibrated work function mapping by Kelvin probe force microscopy.

Pablo A Fernández Garrillo, Benjamin Grévin, Nicolas Chevalier

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