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Dengyan Hu, Jianwen Chen, Wenbo Zhu+5
Jianwen Chen
Wenbo Zhu
Suilong Huang
Wenjun Chen
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015