Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Tao Xiong

2PUBLICATIONS
2CO-AUTHORS
Condensed matter modelling and density functional theorySoft condensed matter
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

Sort by Publication Date:
|Jan 24, 2020
An investigation of the anomalous asymptotic behavior of elastic electron scattering of helium.

Ya-Wei Liu, Tao Xiong, Xin-Chao Huang

|Mar 10, 2019
Generalized oscillator strengths of the low-lying valence-shell excitations of N<sub>2</sub>, O<sub>2,</sub> and C<sub>2</sub>H<sub>2</sub> studied by fast electron and inelastic x-ray scattering.

Ya-Wei Liu, Yi-Geng Peng, Tao Xiong

Pageof 1

Frequent Collaborators

2 joint publications

Xin-Chao Huang

2 joint publications

Lin-Fan Zhu

Frequent Collaborators

2 joint publications

Xin-Chao Huang

2 joint publications

Lin-Fan Zhu

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.3K
Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
07:55

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering

Published on : Apr 17, 2018

13.3K
See more related videos

Top Related Videos

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
11:14

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope

Published on : May 28, 2016

14.3K
Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
07:55

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering

Published on : Apr 17, 2018

13.3K
See more related videos