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Yu Ralchenko

1PUBLICATIONS

7CO-AUTHORS

Electronic device and system performance evaluation, testing and simulation

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Publications (1)

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|Jan 03, 2020

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap.

P Szypryt, G C O'Neil, E Takacs

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P Szypryt

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G C O'Neil

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D A Bennett

1 joint publications

W B Doriese

1 joint publications

J D Gard

1 joint publications

K M Morgan

1 joint publications

D S Swetz

Frequent Collaborators

1 joint publications

P Szypryt

1 joint publications

G C O'Neil

1 joint publications

D A Bennett

1 joint publications

W B Doriese

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