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Xiao Jin, Zijing Li, Yingdan Liu
S Capaccioli, K L Ngai, S Ancherbak
Manoj K Saini, Yuxing Guo, Tao Wu
Manoj K Saini, Xiao Jin, Tao Wu

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on : Jan 26, 2016

High-Resolution Neutron Spectroscopy to Study Picosecond-Nanosecond Dynamics of Proteins and Hydration Water
Published on : Apr 28, 2022

The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on : May 24, 2020