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C M Samuell, A G Mclean, C A Johnson
M A Van Zeeland, T N Carlstrom, D K Finkenthal
T N Carlstrom, F Glass, D Du

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on : Aug 25, 2016

Implementation of a Reference Interferometer for Nanodetection
Published on : Apr 26, 2014

Scanning Light Scattering Profiler (SLPS) Based Methodology to Quantitatively Evaluate Forward and Backward Light Scattering from Intraocular Lenses
Published on : Jun 06, 2017