Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Xiaoxi Fu

5PUBLICATIONS

1CO-AUTHORS

Nonlinear optics and spectroscopyGravimetricsAcceleratorsInstruments and techniques

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (5)

Sort by Publication Date:

|Feb 20, 2021

Dipole-bound and valence excited states of AuF anions via resonant photoelectron spectroscopy.

Yuzhu Lu, Rulin Tang, Xiaoxi Fu

|Mar 23, 2020

Accurate electron affinity of Ga and fine structures of its anions.

Rulin Tang, Xiaoxi Fu, Yuzhu Lu

|Jan 24, 2020

Measurement of electron affinity of iridium atom and photoelectron angular distributions of iridium anion.

Yuzhu Lu, Jing Zhao, Rulin Tang

|Oct 08, 2018

Accurate electron affinity of Ti and fine structures of its anions.

Rulin Tang, Xiaoxi Fu, Chuangang Ning

|Aug 17, 2017

Precision measurement of electron affinity of Zr and fine structures of its negative ions.

Xiaoxi Fu, Jiaming Li, Zhihong Luo

Pageof 1

Frequent Collaborators

5 joint publications

Chuangang Ning

Frequent Collaborators

5 joint publications

Chuangang Ning

Top Related Videos

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F<sup>−</sup>

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F<sup>−</sup>

Published on : Jul 27, 2018

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Published on : Apr 22, 2013

See more related videos

Top Related Videos

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F<sup>−</sup>

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F<sup>−</sup>

Published on : Jul 27, 2018

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Atom Probe Tomography Studies on the Cu(In,Ga)Se<sub>2</sub> Grain Boundaries

Published on : Apr 22, 2013

See more related videos