Get your video featured.
Clémence Tyl, Stéphane Martin, Céline Combettes+6
Vincent Bley
Antoine Belinger
Ronny Brandenburg
Nicolas Naudé
<em>In Situ</em> Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
Published on : Jun 26, 2015