A Casner

2PUBLICATIONS
8CO-AUTHORS
Instruments and techniques
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Publications (2)

|Jul 10, 2021
Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic.

M P Valdivia, D Stutman, C Stoeckl

|Nov 08, 2018
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry.

M P Valdivia, F Veloso, D Stutman

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Frequent Collaborators

1 joint publications

G Rigon

1 joint publications

M P Valdivia

1 joint publications

D Stutman

1 joint publications

C Stoeckl