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A Casner

2PUBLICATIONS

8CO-AUTHORS

Instruments and techniques

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Publications (2)

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|Jul 10, 2021

Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic.

M P Valdivia, D Stutman, C Stoeckl

|Nov 08, 2018

X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry.

M P Valdivia, F Veloso, D Stutman

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Frequent Collaborators

1 joint publications

G Rigon

1 joint publications

M P Valdivia

1 joint publications

D Stutman

1 joint publications

C Stoeckl

1 joint publications

V Bouffetier

1 joint publications

S R Klein

1 joint publications

F Veloso

1 joint publications

F N Beg

Frequent Collaborators

1 joint publications

G Rigon

1 joint publications

M P Valdivia

1 joint publications

D Stutman

1 joint publications

C Stoeckl

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