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Kin P Cheung

1PUBLICATIONS

2CO-AUTHORS

Engineering electromagnetics

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Publications (1)

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|Feb 03, 2019

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station.

Duane J McCrory, Mark A Anders, Jason T Ryan

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Jason P Campbell

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Duane J McCrory

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Jason P Campbell

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