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Juhwan Kim

1PUBLICATIONS

4CO-AUTHORS

Instruments and techniques

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Publications (1)

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|Aug 06, 2020

Application of electrospray-scanning mobility particle sizer for the measurement of sub-10 nm chemical mechanical planarization slurry abrasive size distribution.

Donggeon Kwak, Juhwan Kim, Seungjun Oh

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Frequent Collaborators

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Donggeon Kwak

1 joint publications

Seungjun Oh

1 joint publications

Chulwoo Bae

1 joint publications

Taesung Kim

Frequent Collaborators

1 joint publications

Donggeon Kwak

1 joint publications

Seungjun Oh

1 joint publications

Chulwoo Bae

1 joint publications

Taesung Kim

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