Kangshu Li

2PUBLICATIONS
6CO-AUTHORS
Elemental semiconductorsDeep learning
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (2)

|Aug 06, 2024
Single-Image-Based Deep Learning for Precise Atomic Defect Identification.

Kangshu Li, Xiaocang Han, Yuan Meng

Pageof 1