Gi Dan Shim

1PUBLICATIONS
4CO-AUTHORS
Electrical energy transmission, networks and systems
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Publications (1)

|Jun 22, 2026
Dynamic Probing of Neutron-Induced Reliability Degradation in MoS2 and WS2 Transistors.

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Frequent Collaborators

1 joint publications

Ji Won Heo

1 joint publications

Sungjune Park

1 joint publications

Hagyoul Bae

1 joint publications

TaeWan Kim