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Haipeng Liu, Juan Liu, Jin Huang
Bo Chen, Wei Wang, Juan Liu

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on : Jun 13, 2023

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased <em>a</em>-VO<sub><em>x</em></sub>
Published on : May 13, 2020