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Chao Liu

1PUBLICATIONS
1CO-AUTHORS
Electrical energy storage
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Journal

Publications (1)

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|Oct 26, 2023
Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium.

Chao Liu, Jie Pan, Qihui Yuan

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Frequent Collaborators

1 joint publications

Lin Wang

Frequent Collaborators

1 joint publications

Lin Wang

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