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Longren Li
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Electrochemical energy storage and conversion
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Journal of the American Chemical Society
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Jun 19, 2026
Fast Interfacial Hole Consumption Suppresses Space-Charge Layer Trap Filling in BiVO<sub>4</sub> Photoanodes.
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Tong Wang
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James R Durrant
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Artem A Bakulin
Frequent Collaborators
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Tong Wang
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James R Durrant
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Andreas Kafizas
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Artem A Bakulin
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