Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Juwon Han

2PUBLICATIONS

19CO-AUTHORS

Nanofabrication, growth and self assemblyElectrical energy generation (incl. renewables, excl. photovoltaics)

Featured researcher

Get your video featured.

Publish with JoVE

Featured researcher

Get your video featured.

Publish with JoVE

Publications (2)

Sort by Publication Date:

|Mar 16, 2026

Wafer-Scale Self-Limiting Epitaxy of Bernal-Stacked Single-Crystal Boron Nitride.

Jaewon Wang, Hyeonwoo Lee, Jaemin Kim

|Oct 23, 2025

Contact Physics in 2D Nanoelectronics: Comparative Study of Type-II Weyl and Dirac Semimetals.

Juwon Han, Hyeonwoo Lee, Youseung Lee

Pageof 1

Frequent Collaborators

2 joint publications

Soon-Yong Kwon

2 joint publications

Changwook Jeong

1 joint publications

Taehyun Kim

1 joint publications

Jaewon Wang

1 joint publications

Hyeonwoo Lee

1 joint publications

Haeng Un Yeo

1 joint publications

Cheol Hwan Yoon

1 joint publications

Junseop Noh

1 joint publications

Sora Jang

1 joint publications

Young Ho Jin

Frequent Collaborators

2 joint publications

Soon-Yong Kwon

2 joint publications

Changwook Jeong

1 joint publications

Taehyun Kim

1 joint publications

Jaewon Wang

Top Related Videos

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials

Published on : Jul 18, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

See more related videos

Top Related Videos

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials

Residue-Free Fabrication of van der Waals Heterostructures of Two-Dimensional Materials

Published on : Jul 18, 2025

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on : Dec 05, 2015

See more related videos