Su Huang

1PUBLICATIONS
8CO-AUTHORS
Electronic device and system performance evaluation, testing and simulation
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Featured researcher

Get your video featured.

JoVEPublish with JoVE
Journal

Publications (1)

Sort by Publication Date:
|Jul 14, 2023
5D Analysis of Capacity Degradation in Battery Electrodes Enabled by Operando CT-XANES.

Yuta Kimura, Su Huang, Takashi Nakamura

Pageof 1

Frequent Collaborators

1 joint publications

Yuta Kimura

1 joint publications

Takashi Nakamura

1 joint publications

Nozomu Ishiguro

1 joint publications

Tomonari Takeuchi

1 joint publications

Toyoki Okumura

1 joint publications

Mizuki Tada

1 joint publications

Yoshiharu Uchimoto

1 joint publications

Koji Amezawa

Frequent Collaborators

1 joint publications

Yuta Kimura

1 joint publications

Takashi Nakamura

1 joint publications

Nozomu Ishiguro

1 joint publications

Tomonari Takeuchi

JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies
Jove
Visualize
Contact Us

Top Related Videos

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
08:11

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Published on : Aug 26, 2015

8.9K
See more related videos

Top Related Videos

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
08:11

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Published on : Aug 26, 2015

8.9K
See more related videos