Jianming Huang

1PUBLICATIONS
3CO-AUTHORS
Electrical energy transmission, networks and systems
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Publications (1)

|Mar 02, 2026
Long-Term Operational Stability of Dual-Gated ITO/HfO2 Field-Effect Transistors via Full Top-Gate Coverage: A Comprehensive Bias-Stress Mapping.

Jianming Huang, Arijit Sarkar, Yajing Chai

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Frequent Collaborators

1 joint publications

Arijit Sarkar

1 joint publications

Tania Roy

1 joint publications

Yury Yuryevich Illarionov